Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test
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چکیده
منابع مشابه
Choice of a High-Level Fault Model for the Optimization of Validation Test Set Reused for Manufacturing Test
With the growing complexity of Wireless Systems on Chip integrating hundred-of-million transistors, electronic design methods need to be upgraded to reduce time-tomarket. In this paper, the test benches defined for design validation or characterization of AMS & RF SoCs are optimized and re-used for production testing. Although the original validation test set allows the verification of both des...
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ژورنال
عنوان ژورنال: VLSI Design
سال: 2008
ISSN: 1065-514X,1563-5171
DOI: 10.1155/2008/596146